Pattern testing board

ABSTRACT

A pattern testing system is able to detect an emission beam such as a laser or light beam from a shooting system. A single pattern testing board includes a plurality of paired emission beam sensors and hit indicators. Each emission beam sensor is responsive to a detected emission beam and each hit indicator signals the sensing of the emission beam by the associated emission beam sensor. Multiple pattern testing boards may be mounted together to provide a larger pattern testing system array. Further, an overlay with a representation thereon, a moving image display system, or a reflective moving image display system may be positioned in front of one or more pattern testing boards.

[0001] The present application is a continuation-in-part application of U.S. patent application Ser. No. 09/019,152, filed Feb. 6, 1998 which is a continuation of U.S. patent application Ser. No. 08/753,537, filed Nov. 26, 1996, which has issued as U.S. Pat. No. 5,716,216 on Feb. 10, 1998.

BACKGROUND OF THE INVENTION

[0002] The present invention relates to a pattern testing board for use in a system for simulating shooting sports such as the systems described in U.S. patent application Ser. No. 09/019,152 and U.S. Pat. No. 5,716,216, both of which are assigned to the assignee of this application and are incorporated herein by reference.

[0003] U.S. patent application Ser. No. 09/019,152 and U.S. Pat. No. 5,716,216 are directed to a system for simulating shooting sports including a non-projectile ammunition transmitter system that is retrofittable to any standard firearm having an ammunition chamber, a barrel, and a firing pin and a self-contained receiver system. The transmitter system includes an actuating beam cartridge and an adjustable beam choke. The beam cartridge includes a first actuating beam emitter responsive to the firing pin. The beam choke includes a second emission beam emitter responsive to the first actuating beam. The receiver system is a self-contained reusable target having beam sensors and hit indicators. The beam sensors are “triggered” when the emission beam “hits” or is “sensed by” the beam sensors. When the beam sensors sense the emission beam, they cause the hit indicators to indicate that the target has been “hit” by the emission beam. The target may also include at least one triggering motion detector that detects a triggering motion that is associated with the target being launched into the air.

[0004] Target boards have been used to test non-projectile output from firearms. Exemplary target boards are disclosed in U.S. Pat. No. 4,195,422 to Budmiger, U.S. Pat. No. 4,640,514 to Myllyla et al., and U.S. Pat. No. 4,662,845 to Gallagher et al. Many target boards, including the board disclosed in the Budmiger reference, has one or more detector that senses a beam or pulse and then transmits information to the shooter as to which section or ring of the target was “hit” by the beam or pulse. Other target boards use a simple reflective system that reflects a beam, such as a light beam, back to the shooter. The Myllyla et al. system, which uses a reflector, is a typical example of this type of reflective system. Another type of target board uses sound and/or motion to indicate that the target has been hit by a beam. The Gallagher et al. system is a typical example of this type of sound/motion system.

[0005] None of the known target systems provide detailed information as to the size of the beam, the shape of the beam, and what portion of the beam has hit the target.

BRIEF SUMMARY OF THE INVENTION

[0006] The present invention is directed to a pattern testing board suitable for use with a system for simulating shooting sports such as that described in U.S. patent application Ser. No. 09/019,152 and U.S. Pat. No. 5,716,216. The pattern testing board is able to provide an immediate informative response to a shooter regarding the size of the beam, the shape of the beam, and what portion of the beam has hit the target testing board.

[0007] A pattern testing board of the present invention is able to detect an emission beam such as a laser or light beam from a shooting system. The pattern testing board includes a plurality of paired emission beam sensors and hit indicators. Each emission beam sensor is responsive to a detected emission beam and each hit indicator signals the sensing of the emission beam by the associated emission beam sensor.

[0008] Pursuant to a separate preferred aspect of the present invention, multiple pattern testing boards may be mounted together to provide a larger target array or system.

[0009] Further, an overlay may be positioned in front of a singular patten testing board or in front of the array of boards. The overlay may have one or more representations thereon depicting, for example, a silhouette or facsimile of a human, an animal, a bird, a shooting clay, or an alternate target. The overlay may include special markings or colors to indicate specific “kill” zones.

[0010] Finally, a moving image display system or a reflective moving image display system may be positioned in front of a singular pattern testing board or in front of an array of pattern testing boards. These display systems are light permeable to allow an emission beam to pass through and to allow viewing of the lit IC/amplifier/LED circuits

[0011] The foregoing and other objectives, features, and advantages of the invention will be more readily understood upon consideration of the following detailed description of the invention, taken in conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING

[0012]FIG. 1 is a plan diagram of a system for simulating shooting sports including a transmitter system and a receiver system.

[0013]FIG. 2a is a cross-sectional side view of a beam cartridge.

[0014]FIG. 2b is a cross-sectional front view of a beam cartridge.

[0015]FIG. 3 is a diagram of the mechanical and electronic circuitry of the beam cartridge.

[0016]FIG. 4 is a cross-sectional side view of a beam choke including a variable choke grip.

[0017]FIG. 5 is a cross-sectional side view of an alternate embodiment of the lens system.

[0018]FIG. 6 is a front plan view of a pattern testing board.

[0019]FIG. 7 is an exploded side view of the pattern testing board.

[0020]FIG. 8 is a circuit diagram of an infrared detection IC/amplifier/LED circuit on the box PWB.

[0021]FIG. 9 is a partial simplified diagram of a box printed wiring board of the pattern testing board.

[0022]FIG. 10 is a front plan view of an alternate pattern testing board.

[0023]FIG. 11 is a front plan view of an array of pattern testing boards with an overlay thereover.

[0024]FIG. 12 is a side view of the array and overlay of FIG. 11.

[0025]FIG. 13 is a front plan view of an array of platform testing boards with a preferred embodiment of a moving image display system thereover.

[0026]FIG. 14 is a side plan view of an array of pattern testing boards with a preferred embodiment of a reflective moving image display system thereover.

DETAILED DESCRIPTION OF THE INVENTION

[0027] For the purpose of providing a background for the present invention, the system for simulating shooting sports described in U.S. patent application Ser. No. 09/019,152 and U.S. Pat. No. 5,716,216 is set forth below. Both U.S. patent application Ser. No. 09/019,152 and U.S. Pat. No. 5,716,216 are assigned to the assignee of this application and are incorporated by reference herein. Reference numerals used in the previous applications have been maintained for consistency, however, for the purpose of brevity, some of the figures have been omitted.

[0028] As shown in FIG. 1, a system for simulating shooting sports includes a non-projectile transmitter system 25 and a self contained receiver system 27. The transmitter system 25 is retrofittable to any standard firearm 16 having an ammunition chamber 17, a barrel 18, and a firing pin 19.

[0029] The transmitter system 25, as detailed in FIGS. 2-5, preferably includes an actuating beam (or wave) cartridge 20 and an adjustable beam (or wave) choke 21. The beam cartridge 20 has dimensions substantially identical to the dimensions of standard projectile or shot cartridges and therefore fits into the ammunition chamber 17 of a standard firearm 16. The beam choke 21 is adapted to fit into the barrel 18 of a standard firearm 16. When a firearm 16 is “fired,” the firing pin 19 strikes the beam cartridge 20 which emits a first or actuating beam (or wave) 22 (shown in phantom in FIG. 1) which may be any electromagnetic beam, but is shown as a beam of light. The actuating beam 22 activates the beam choke 21 which emits a second or emission beam (or wave) 24 (shown in phantom in FIG. 1) which may be any electromagnetic beam, but is shown in one embodiment as a laser beam and in another embodiment as a beam of light. Use of the actuating beam 22 as a link between the beam cartridge 20 and the beam choke 21 facilitates the use of the system with firearms of most barrel lengths.

[0030] Although the transmitter system 25 of the simulation system may be used with a self contained receiver system 27, a pattern testing board 300, as shown in FIGS. 6-9, was originally contemplated as an auxiliary component of the simulation system. The pattern testing board 300 described in U.S. patent application Ser. No. 09/019,152 and U.S. Pat. No. 5,716,216 can detect and display the actual pattern of the emission beam 24 emanating from the beam choke 21. By displaying the actual beam pattern, firearm operation and shot pattern can be verified. To do this, the pattern testing board 300 is placed at a distance of 35 yards from the shooter either behind the target catch net or to the side. One or more shooters can sight and shoot at the pattern testing board 300. The pattern testing board 300 will display a pattern representative of the shape of the emission beam 24 at, for example, 35 yards.

[0031] As shown in FIGS. 6-7, one preferred embodiment of the pattern testing board 300 consists of a central target disk 302 with central box LED 304, a plurality of box printed wiring boards (PWBs) 306 which, in this embodiment, are arranged radially around the box LED 304, a power source 308, an ON/OFF switch 310, and an enclosing case 312. Each of the box PWBs 306 contain a set (shown as eighteen) of IR detection IC/amplifier/LED circuits 314 (FIG. 8) that are spaced 1″ apart. More or less PWBs may be used on a board and the spacing may be adjusted.

[0032] An exemplary case or housing 312 of the pattern testing board 300 is shown in FIG. 7. The housing 312 may be constructed of any sturdy building material such as wood or metal. The example shown includes case components such as an exterior frame 313 a, an inset panel 313 b for mounting the box PWBs 306 and central target disk 302, a back cover 313 c, as well as additional braces. The pattern testing board 300 may also include a polycarbonate front sheet 313 d to protect the electronic circuitry from damage.

[0033] As shown in the exemplary embodiment of FIGS. 6 and 7, a power source 308 (shown in phantom) that is connected to conventional 120 V_(AC) power may be mounted on the inside, bottom of the pattern testing board 300. Each of the box PWBs 306, that are preferably spaced radially about a central box LED 304, are each electrically connected to the power source 308. Preferably the central target disk 302 is also connected to the power source 308 so that the central box LED 304 is illuminated when the pattern testing board 300 is receiving power. The illuminated central box LED 304 also draws the shooter's attention to the center of the pattern testing board 300. As shown in FIG. 6, the array pattern is 40″ in diameter and has 216 detection sites. Larger or smaller array patterns are contemplated in the scope of this invention. The ON/OFF switch 310 may be a conventional wall switch or other toggle device that is mounted on the side of the housing 312.

[0034] When a beam detection IC/amplifier/LED circuit 314 is illuminated by an emission beam 24 pulsing at a predefined rate for a duration of 1 to 8 milliseconds, the associated LED lights up for a duration of approximately 2 seconds. Both the duration of the pulse and the duration the LED remains lit are exemplary and, in one embodiment, may be adjustable. The resulting display of lit LEDs indicates the location and pattern of the emission beam 24 on the pattern testing board 300. Each of the box PWBs 306 includes a set of beam detection IC/amplifier/LED circuits 314 such as those shown in FIG. 8. As shown, each circuit 314 includes a photo IC (U1) 316 which is a high sensitivity, photo diode, and bandpass amplifier in a single integrated circuit package that is sensitive to the emission beam 24.

[0035] Turning to the exemplary electronics, when the output of U1 316 is High (not illuminated), diode D1 318 is non-conducting, P channel MOSFET (Q1) 320 is nonconducting, C1 has been charged to V_(CC) by R2, and Q1 drain (D), R3, and LED1 are at ground potential. When the output of U1 316 goes Low (illumination detected), D1 318 conducts which brings the D1 anode junction with R1 to about 1 volt above ground. If the output of U1 316 remains Low, the voltage across C1 decreases from V_(CC) to +1 volt. As the voltage across C1 decreases, the source-to-gate voltage of Q1 320 increases causing Q1 320 to conduct when the voltage difference exceeds 2 volts. With the Q1 source at +5 volts and the Q1 gate at +1 volt, Q1 source-to-drain (D) resistance appears to be under 10 ohms. With Q1 320 conducting, R3 will pull LED1 322 anode High until LED1 322 begins conducting at +1.6 volts. LED1 322 will remain illuminated as long as U1 316 output is Low. When U1 V_(out) returns to High, D1 318 becomes reversed biased and ceases to conduct. However, the voltage across C1 proceeds to increase from +1V to V_(CC) due to the current supplied by R2. As the voltage across C1 increases the gate-to-source voltage of Q1 320 decreases. Q1 source-to-drain resistance increases until Q1 320 ceases to conduct depriving LED1 322 of all illumination. R2 and C1 form a time constant of about 1.5 seconds resulting in current flow through LED1 322 for about 2 seconds after U1 V_(out) goes High. This procedure causes LED1 322 to remain visible for a predefined time period, such as 2 seconds, after being triggered. Other features of the circuitry include the fact that R1 and C1 form a low pass filter to reject quick, short duration excursion of U1 _(out) Low caused by noise. R1 also limits the surge in current that would occur if D1 318 were directly connected to C1.

[0036] FIGS. 10-12 show a separate preferred aspect of the pattern testing board 400. This alternate pattern testing board 400, like pattern testing board 300, can detect and display the actual pattern of the emission beam 24 emanating from the beam choke 21. By displaying the actual beam pattern, firearm operation and shot pattern can be verified. To do this, the pattern testing board 400 is placed at a distance from the shooter either behind the target catch net or to the side. One or more shooters can sight and shoot at the pattern testing board 400. The pattern testing board 400 will display a pattern representative of the shape of the emission beam 24 at 35 yards. These distances are meant to be exemplary and not to limit the scope of the invention.

[0037] As shown in FIG. 10, the alternate preferred embodiment of the pattern testing board 400 consists of an array of IC/amplifier/LED circuits 314 (shown as a 12×12 array) spaced 1″ apart. The array may be created by mounting, for example, twelve (12) box printed wiring boards (PWBs), such as those shown in FIGS. 6 and 9, vertically or horizontally. If each PWB had twelve IC/amplifier/LED circuits 314, a 12×12 array would be produced. Alternately, 144 IC/amplifier/LED circuits 314 may be mounted separately to produce the 12×12 array. It should be noted, of course, that the array may be of any size or dimension, the spacing may be changed, and alternate shapes are contemplated.

[0038] When a beam detection IC/amplifier/LED circuit 314 is illuminated by an emission beam 24 pulsing at a predefined rate for a duration of 1 to 8 milliseconds, the associated LED lights up for a duration of approximately 2 seconds. The resulting display of lit LEDs indicates the location and pattern of the emission beam 24 on the pattern testing board 400. As set forth above, the pulse duration and the duration the LEDs remain lit are exemplary and, in one embodiment, may be adjustable.

[0039] The housing, power source, and ON/OFF switch of the alternate pattern testing board 400 may be identical to that shown in FIG. 7 or may be a variation thereof.

[0040] Optionally, if a single alternate pattern testing board 400 is used, one or more central IC/amplifier/LED circuits 402 may be constantly illuminated while the pattern testing board 400 is receiving power. The illuminated IC/amplifier/LED circuits 402 indicate that the board 400 is receiving power and draw the shooter's attention to the center of the pattern testing board 400. The constantly illuminated central IC/amplifier/LED circuits 402 may be in a pattern such as a “+”.

[0041] Further, if a single alternate pattern testing board 400 is used, exterior IC/amplifier/LED circuits 404 outside a predetermined circular area 406 may optionally be deactivated or blocked by an opaque cover. Blocking the exterior IC/amplifier/LED circuits 404 conveys the appearance that the emission beam 24 is circular to the shooter. Although emission beams 24 are not always circular, it is sometimes desirable to enforce this illusion.

[0042]FIGS. 11 and 12 show a multiple pattern testing board array or system 408. Although the system 408 is shown as an array of fifteen pattern testing boards 400, the system may be of any size or dimension. The system provides a large target testing pattern that is of a size sufficient to accommodate a representation of a silhouette or facsimile of a human, an animal, a bird, a shooting clay, or other desired target. The pattern testing boards 400 in the system 408 are preferably electrically interconnected. Also, if used in a system, preferably the boards would not have illuminated central IC/amplifier/LED circuits 402 or blocked or deactivated exterior IC/amplifier/LED circuits 404. In this manner a uniform system 408 of approximately 1″ resolution is created. By adjusting the spacing of the circuits 314 the sensitivity may be adjusted.

[0043] Further, an overlay 410 may be used with a representation 412 thereon. The overlay is preferably a substantially clear sheet of plastic or other clear material that allows the emission beam 24 to pass through and the shooter to view the illuminated IC/amplifier/LED circuits 314. The overlay 410 may be suspended in front of the array 408 or may be attached directly thereto. A removable overlay 410 would allow the option of changing the representation 412 to depict alternate targets.

[0044] The representation 412 may depict a silhouette or a facsimile of a human, an animal, a bird, a shooting clay, or an alternate target. The overlay 410 may also include special markings or colors to differentiate specific “kill” (or “wound”) zones 414 within the representation 412.

[0045]FIG. 13 shows the multiple pattern testing board array 408 positioned behind a moving image display system 500 capable of displaying light permeable static or moving images 502. The images 502 may be generated by a computer 504. Like the overlay 410, the emission beam 24 passes through the display system 500 to activate the IC/amplifier/LED circuits 314. Because the display system 500 is light permeable, the shooter can view the lit IC/amplifier/LED circuits 314 to determine the accuracy of his hit.

[0046]FIG. 14 shows a reflective moving image display system 510 that is positioned in front of the multiple pattern testing board array 408. The reflective system 510 is capable of displaying static or moving light permeable images 512 on a reflective, light permeable display 514. The reflective display 514 may be a sheet of glass. The images 512 could be generated by a computer 516 and displayed on a display screen 518. The images 512 on the display screen 518 are then reflected onto the reflective display 514. The emission beam 24 passes through the reflective display 514 to activate the IC/amplifier/LED circuits 314. Because the reflective display 514 is light permeable, the shooter can view the lit IC/amplifier/LED circuits 314 to determine the accuracy of his hit.

[0047] The system 408 may be constructed by mounting the pattern testing boards 400 to a frame structure 416 using attachment apparatus 418 such as screws or mounting posts. The frame structure 416 may be a back board, metal bars, or other suitable sturdy structure. Each board 400 may include one or more mounting hole 420 through which the attachment apparatus 418 is inserted. Alternatively the boards 400 may be equipped with interlocking structure or may be mounted together, with or without a frame structure, using traditional means such as glue or mounting tape.

[0048] Finally, it should be noted that the pattern testing board and system described above may be used with any system that emits a proper emission beam and, therefore, is not limited to the transmitter system described herein. Suitable beams include, but are not limited to, light beams and laser beams.

[0049] The terms and expressions which have been employed in the foregoing specification are used therein as terms of description and not of limitation, and there is no intention, in the use of such terms and expressions, of excluding equivalents of the features shown and described or portions thereof, it being recognized that the scope of the invention is defined and limited only by the claims which follow. 

1. A pattern testing board for detecting an emission beam's presence and pattern, said pattern testing board comprising: (a) a plurality of emission beam sensors responsive to said emission beam; and (b) a plurality of hit indicators each associated with and responsive to at least one emission beam sensor; and (c) wherein said hit indicators signal the sensing of said emission beam by said associated emission beam sensor.
 2. The pattern testing board of claim 1 wherein each hit indicator is associated with and responsive to a respective emission beam sensor, each said hit indicator signaling the sensing of said emission beam by its respective emission beam sensor.
 3. The pattern testing board of claim 1 wherein said hit indicators are arranged substantially symmetrically around a central point.
 4. The pattern testing board of claim 1 wherein said emission beam sensors are arranged substantially symmetrically around a central point.
 5. The pattern testing board of claim 1 wherein said hit indicators are illuminated when their associated emission beam sensor senses the presence of said emission beam.
 6. The pattern testing board of claim 1 wherein said hit indicators are illuminated when their associated emission beam sensor senses the presence of said emission beam and for an additional predefined period of time thereafter.
 7. The pattern testing board of claim 1 wherein said hit indicators are arranged in an array.
 8. The pattern testing board of claim 1 wherein said emission beam sensors are arranged in an array.
 9. The pattern testing board of claim 1 wherein an overlay is positioned in front of said pattern testing board.
 10. The pattern testing board of claim 1 wherein a moving image display system is positioned in front of said pattern testing board.
 11. The pattern testing board of claim 1 wherein a reflective moving image display system is positioned in front of said pattern testing board.
 12. The pattern testing board of claim 1 wherein a plurality of said pattern testing boards are arrangable in an array.
 13. The pattern testing board of claim 12 wherein an array of pattern testing boards are mountable to support structure.
 14. The pattern testing board of claim 12 wherein an array of pattern testing boards are electrically interconnectable.
 15. The pattern testing board of claim 12 wherein an overlay is positioned in front of an array of pattern testing boards.
 16. The pattern testing board of claim 15 wherein said hit indicators are viewable through said overlay.
 17. The pattern testing board of claim 15 wherein said overlay is suitable to allow said emission beam to pass through.
 18. The pattern testing board of claim 15 wherein said overlay has a representation thereon.
 19. The pattern testing board of claim 18 wherein said overlay has “kill zones” depicted within said representation.
 20. The pattern testing board of claim 12 wherein a moving image display system is positioned in front of an array of pattern testing boards.
 21. The pattern testing board of claim 20 wherein said hit indicators are viewable through said moving image display system.
 22. The pattern testing board of claim 20 wherein said moving image display system is suitable to allow said emission beam to pass through.
 23. The pattern testing board of claim 12 wherein a reflective moving image display system is positioned in front of an array of pattern testing boards.
 24. The pattern testing board of claim 23 wherein said hit indicators are viewable through said reflective moving image display system.
 25. The pattern testing board of claim 23 wherein said reflective moving image display system is suitable to allow said emission beam to pass through.
 26. A pattern testing system for detecting an emission beam's presence and pattern, said pattern testing system comprising: (a) a plurality of paired emission beam sensors and hit indicators, each emission beam sensor responsive to said emission beam, each hit indicator is associated with and responsive to at least one emission beam sensor, and each said hit indicator signaling the sensing of said emission beam by said associated emission beam sensor; (b) a plurality of pattern testing boards, each pattern testing board having an array of said paired emission beam sensors and hit indicators thereon; (c) said plurality of pattern testing boards arrangable in an array and electrically interconnectable; (d) an overlay positionable in front of said plurality of pattern testing boards, said hit indicators being viewable through said overlay, and said overlay being permeable to said emission beams.
 27. The pattern testing system of claim 26 wherein an array of pattern testing boards are mountable to support structure.
 28. The pattern testing board of claim 26 wherein said overlay has a representation thereon.
 29. The pattern testing board of claim 28 wherein said overlay has “kill zones” depicted within said representation. 